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Atomic force microscopy (AFM) probe

by leo_corte

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AFM atomic force Laboratory Material Science probe scale model science science education SPM AFM atomic force Laboratory Material Science probe scale model science science education SPM

Atomic force microscopy probes are regularly used to characterize surfaces at the nanoscale. One of the most common designs consists of a sharp tip at the end of a bendable cantilever connected to a massive chunk of silicon (the massive chunk of silicon is to make handling easy).
This model is a scale model of one of such probes to assist during demonstrations. The cantilever should be flexible enough to demonstrate bending and resonance, and the tip is sharp enough to show the main issues foun

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