Atomic force microscopy (AFM) probes

Hello!
Héctor here, zour AFM expert at Nanosurf!

Atomic force microscopy probes are regularly used to characterize surfaces at the nanoscale. One of the most common designs consists of a sharp tip at the end of a bendable cantilever connected to a massive chunk of silicon (the massive chunk of silicon is to make handling easy).
Here I put together several common designs: standard; elephant trunk; tipless; colloidal; fpippete; funtionaliyed; to assist during demonstrations. The cantilever should be flexible enough to demonstrate bending and resonance, and the tip is sharp enough to show the main issues found while scanning (e.g. convolution).
The model is loosely based on commercial probe designs, keeping the aspect ratio but without trying to match the geometrical features of a specific commercial probe.

There is a full version, and one with interchangeable cantilevers.